Measurement-induced criticality and charge-sharpening transitions
Romain Vasseur University of Massachusetts Amherst
Romain Vasseur University of Massachusetts Amherst
Aleksandra Utiralova Massachusetts Institute of Technology (MIT)
Antonia Micol Frassino Universitat de Barcelona
Monica Guica University of Paris-Saclay
Sung-Sik Lee McMaster University
Kyriakos Destounis University of Tübingen
Daniel Ranard California Institute of Technology (Caltech)
Chris Akers Massachusetts Institute of Technology (MIT)